Embedded synthetic instruments for board-level testingJutman, Artur; Devadze, Sergei; Aleksejev, Igor; Wenzel, ThomasProceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France2012 / 1 p. : ill

FP7 collaborative research project DIAMOND : diagnosis, error modeling and correction for reliable systems designRaik, JaanProceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France2012 / 1 p https://ieeexplore.ieee.org/document/6233052

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