Measurement of charge carrier lifetime temperature dependence in 4H-SiC power diodes
Velmre, Enn
;
Udal, Andres
Abstracts of International Conference on Silicon Carbide and Related Materials : ICSCRM'99 : October 10-15, 1999, Research Triangle Park, North-Carolina, USA
1999
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paper no 394, 2 p
https://www.researchgate.net/publication/240833834_Measurement_of_Charge_Carrier_Lifetime_Temperature-Dependence_in_4H-SiC_Power_Diodes