• Double phase fault collapsing with linear complexity in digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Orasson, Elmet; Josifovska, Galina; Oyeniran, Adeboye StephenDSD 2015 : 18th Euromicro Conference on Digital Systems Design : 26-28 August 2015, Funchal, Madeira, Portugal2015 / p. 700-705 : ill
• Fault collapsing in digital circuits using fast fault dominance and equivalence analysis with SSBDDsUbar, Raimund-Johannes; Jürimägi, Lembit; Orasson, Elmet; Raik, JaanVLSI-SoC : Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015 Daejeon, Korea, October 5-7, 2015 : revised selected papers2016 / p. 23-45 : ill https://doi.org/10.1007/978-3-319-46097-0_2 https://www.scopus.com/sourceid/19400157163 https://www.scopus.com/record/display.uri?eid=2-s2.0-84990032811&origin=inward&txGid=0d26bc6e9683eda5b12413cb88f860aa https://www.webofscience.com/wos/woscc/full-record/WOS:000392266400002
• Logic simulation and fault collapsing with shared structurally synthesized BDDsMironov, Dmitri; Ubar, Raimund-Johannes; Raik, Jaan2014 19th IEEE European Test Symposium (ETS) : May 26th-30th, 2014, Paderborn, Germany : proceedings2014 / [2] p. : ill
• Modeling sequential circuits with shared structurally synthesized BDDsUbar, Raimund-Johannes; Marenkov, Mihhail; Mironov, Dmitri; Viies, VladimirProceedings of 2014 9th International Design & Test Symposium (IDT) : Sheraton Club des Pins Hotel, Algiers, Algeria, December 16-18, 20142014 / p. 130-135 : ill
• Scalable algorithm for structural fault collapsing in digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Orasson, Elmet; Raik, Jaan2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) : October 5-7, 2015, Daejeon, Korea2015 / p. 171-176 : ill