Nanoparticulate dielectric overlayer for enhanced electric fields in a capacitive deionization device
Laxman, Karthik
;
Kimoto, Daiki
;
Sahakyan, Armen
;
Dutta, Joydeep
ACS applied materials and interfaces
2018
/
8 p. : ill.
https://doi.org/10.1021/acsami.7b16540
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
Non-destructive eddy current measurments for silicon carbide heterostructure analysis
Sahakyan, Armen
;
Koel, Ants
;
Rang, Toomas
Materials and contact characterisation VIII
2017
/
p. 49-60 : ill
http://dx.doi.org/10.2495/MC170061