Nanoparticulate dielectric overlayer for enhanced electric fields in a capacitive deionization device
Laxman, Karthik
;
Kimoto, Daiki
;
Sahakyan, Armen
;
Dutta, Joydeep
ACS applied materials and interfaces
2018
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8 p. : ill.
https://doi.org/10.1021/acsami.7b16540
https://www.scopus.com/sourceid/19700171101
https://www.scopus.com/record/display.uri?eid=2-s2.0-85042051819&origin=inward&txGid=cc08785113b1c893f4cc24d5fc49e63e
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=ACS%20APPL%20MATER%20INTER&year=2022
https://www.webofscience.com/wos/woscc/full-record/WOS:000425572700090
Non-destructive eddy current measurments for silicon carbide heterostructure analysis
Sahakyan, Armen
;
Koel, Ants
;
Rang, Toomas
Materials and contact characterisation VIII
2017
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p. 49-60 : ill
https://doi.org/10.2495/MC170061
https://www.scopus.com/sourceid/6000195382
https://www.scopus.com/record/display.uri?eid=2-s2.0-85039058119&origin=inward&txGid=72f8ed67790fde317966170b760cdd41