• Health management for self-aware SoCs based on IEEE 1687 infrastructureShibin, Konstantin; Devadze, Sergei; Jutman, Artur; Grabmann, Martin; Pricken, RobinIEEE Design & Test2017 / p. 27-35 : ill https://doi.org/10.1109/MDAT.2017.2750902 https://www.scopus.com/sourceid/21100286806 https://www.scopus.com/record/display.uri?eid=2-s2.0-85037723856&origin=inward&txGid=43952d2af7eb29d9046c148b7fce363e https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20DES%20TEST&year=2017 https://www.webofscience.com/wos/woscc/full-record/WOS:000416261800004
• On-chip sensors data collection and analysis for SoC health managementShibin, Konstantin; Jenihhin, Maksim; Jutman, Artur; Devadze, Sergei; Tsertov, Anton2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)2023 / 6 p https://doi.org/10.1109/DFT59622.2023.10313562