• Composing graph theory and deep neural networks to evaluate SEU type soft error effectsBalakrishnan, Aneesh; Lange, Thomas; Glorieux, Maximilien; Alexandrescu, Dan; Jenihhin, Maksim9th Mediterranean Conference on Embedded Computing (MECO'2020), Budva, Montenegro, 8-11 June 20202020 https://doi.org/10.1109/MECO49872.2020.9134279
• Enabling cross-layer reliability and functional safety assessment through ML-based compact modelsAlexandrescu, Dan; Balakrishnan, Aneesh; Lange, Thomas; Glorieux, MaximilienProceedings : 2020 26th IEEE International Symposium on On-Line Testing and Robust System Design : IOLTS 2020, Napoli, Italy, July 13-16, 2020 : virtual edition2020 / 6 p. : ill https://doi.org/10.1109/IOLTS50870.2020.9159750
• Gate-level graph representation learning : a step towards the improved stuck-at faults analysisBalakrishnan, Aneesh; Alexandrescu, Dan; Jenihhin, Maksim; Lange, Thomas; Glorieux, MaximilienProceedings of the Twenty Second International Symposium on Quality Electronic Design (ISQED) : Santa Clara, USA, 7-9 April 20212021 / p. 24-30 https://doi.org/10.1109/ISQED51717.2021.9424256
• Machine learning clustering techniques for selective mitigation of critical design featuresLange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, LucaProceedings : 2020 26th IEEE International Symposium on On-Line Testing and Robust System Design : IOLTS 2020, Napoli, Italy, July 13-16, 2020 : virtual edition2020 / 7 p. : ill https://doi.org/10.1109/IOLTS50870.2020.9159751
• Machine learning to tackle the challenges of transient and soft errors in complex circuitsLange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019, Greece2019 / p. 7-14 : ill https://doi.org/10.1109/IOLTS.2019.8854423
• Modeling gate-level abstraction hierarchy using graph convolutional neural networks to predict functional de-rating factorsBalakrishnan, Aneesh; Lange, Thomas; Glorieux, Maximilien; Alexandrescu, Dan; Jenihhin, Maksim2019 NASA/ESA conference on adaptive hardware and systems AHS 2019 : proceedings2019 / p. 72-78 : ill https://doi.org/10.1109/AHS.2019.00007
• On antagonism between side-channel security and soft-error reliability in BNN inference enginesLai, Xinhui; Lange, Thomas; Balakrishnan, Aneesh; Alexandrescu, Dan; Jenihhin, MaksimIFIP/IEEE 29th International Conference on Very Large Scale Integration (VLSI-SoC)2021 / p. 1-6 https://doi.org/10.1109/VLSI-SoC53125.2021.9606981
• On the estimation of complex circuits functional failure rate by machine learning techniquesLange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks - DSN 2019 : Supplemental Volume : proceedings2019 / p. 35-41 : ill https://doi.org/10.1109/DSN-S.2019.00021
• Tau lepton identification and reconstruction : a new frontier for jet-tagging ML algorithmsLange, Thomas; Nandan, Saswati; Pata, Joosep; Tani, Laurits; Veelken, ChristianComputer physics communications2024 / art. 109095 https://doi.org/10.1016/j.cpc.2024.109095
• Tau lepton identification and reconstruction : a new frontier for jet-tagging ML algorithms : [preprint]Lange, Thomas; Nandan, Saswati; Pata, Joosep; Tani, Laurits; Veelken, ChristianarXiv.org2023 / 22 p. : ill https://doi.org/10.48550/arXiv.2307.07747
• The validation of graph model-based, gate level low-dimensional feature data for machine learning applicationsBalakrishnan, Aneesh; Lange, Thomas; Glorieux, Maximilien; Alexandrescu, Dan; Jenihhin, Maksim2019 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC), 29-30 October 2019, Helsinki, Finland : proceedings in IEEE Xplore2019 / 7 p https://doi.org/10.1109/NORCHIP.2019.8906974
• Understanding multidimensional verification : where functional meets non-functionalLai, Xinhui; Balakrishnan, Aneesh; Lange, Thomas; Jenihhin, Maksim; Ghasempouri, Tara; Raik, Jaan; Alexandrescu, DanMicroprocessors and microsystems2019 / art. 102867, 13 p. : ill https://doi.org/10.1016/j.micpro.2019.102867 https://www.scopus.com/sourceid/15552 https://www.scopus.com/record/display.uri?eid=2-s2.0-85071020969&origin=inward&txGid=87d2f90199a10d44d941b14d594d2f30 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=MICROPROCESS%20MICROSY&year=2022 https://www.webofscience.com/wos/woscc/full-record/WOS:000500052000047