• Accelerating transient fault injection campaigns by using Dynamic HDL SlicingBagbaba, Ahmet Cagri; Jenihhin, Maksim; Raik, Jaan; Sauer, Christian2019 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC), 29-30 October 2019, Helsinki, Finland : proceedings in IEEE Xplore2019 / 7 p. : ill https://doi.org/10.1109/NORCHIP.2019.8906932
• Automated identification of application-dependent safe faults in automotive systems-on-a-chipsBagbaba, Ahmet Cagri; Augusto da Silva, Felipe; Sonza Reorda, Matteo; Hamdioui, Said; Jenihhin, Maksim; Sauer, ChristianElectronics2022 / art. 319 https://doi.org/10.3390/electronics11030319 https://www.scopus.com/sourceid/21100829272 https://www.scopus.com/record/display.uri?eid=2-s2.0-85122936454&origin=inward&txGid=5d6e8d72b1ef5e0219cb0f5191808c5d https://jcr.clarivate.com/jcr-jp/journal-profile?journal=ELECTRONICS-SWITZ&year=2022 https://www.webofscience.com/wos/woscc/full-record/WOS:000759878100001
• Combining fault analysis technologies for ISO26262 functional safety verificationAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian2019 IEEE 28th Asian Test Symposium (ATS) : 10–13 December 2019, Kolkata, India : proceedings2019 / p. 129–134 : ill https://doi.org/10.1109/ATS47505.2019.00024
• Determined-safe faults identification : a step towards ISO26262 hardware compliant designsAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Sartoni, Sandro; Cantoro, Riccardo; Sonza Reorda, Matteo; Hamdioui, Said; Sauer, Christian2020 25th IEEE European Test Symposium (ETS)2020 / 6 p. : ill https://doi.org/10.1109/ETS48528.2020.9131568
• Efficient fault injection based on dynamic HDL slicing techniqueBagbaba, Ahmet Cagri; Jenihhin, Maksim; Raik, Jaan; Sauer, Christian2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece2019 / p. 52-53 : ill https://doi.org/10.1109/IOLTS.2019.8854419
• Efficient methodology for ISO26262 functional safety verificationAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019, Rhodes, Greece2019 / p. 255-256 https://doi.org/10.1109/IOLTS.2019.8854449
• Enabling cross-layer reliability and functional safety assessment through ML-based compact modelsAlexandrescu, Dan; Balakrishnan, Aneesh; Lange, Thomas; Glorieux, MaximilienProceedings : 2020 26th IEEE International Symposium on On-Line Testing and Robust System Design : IOLTS 2020, Napoli, Italy, July 13-16, 2020 : virtual edition2020 / 6 p. : ill https://doi.org/10.1109/IOLTS50870.2020.9159750
• Improving the confidence level in functional safety simulation tools for ISO 26262Bagbaba, Ahmet Cagri; Augusto da Silva, Felipe; Sauer, Christian2018 Design and Verification Conference (DVCON) Europe : [proceedings]2018 / 6 p. : ill https://dvcon-proceedings.org/document/improving-the-confidence-level-in-functional-safety-simulation-tools-for-iso-26262/ https://zenodo.org/record/3361607#.Y0PHFnZByHs
• Representing gate-level SET faults by multiple SEU faults on RT-levelBagbaba, Ahmet Cagri; Jenihhin, Maksim; Ubar, Raimund-Johannes; Sauer, Christian2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020 : proceedings2020 / art. 19889351, 6 p. : ill https://doi.org/10.1109/IOLTS50870.2020.9159715
• Special session : AutoSoC - a suite of open-source automotive SoC benchmarksSilva, Felipe Augusto da; Bagbaba, Ahmet Cagri; Ruospo, Annachiara; Jenihhin, Maksim2020 IEEE 38th VLSI TEST SYMPOSIUM (VTS) - VTS 2020 : proceedings2020 / 9 p. : ill https://doi.org/10.1109/VTS48691.2020.9107599 https://www.scopus.com/sourceid/14939 https://www.scopus.com/record/display.uri?eid=2-s2.0-85086505407&origin=inward&txGid=bed9952d8e62b54a39971e249e5e1ba3 https://www.webofscience.com/wos/woscc/full-record/WOS:000590395200020