• IEEE European Test Symposium (ETS)Eggersgluss, Stephan; Hamdioui, Said; Jutman, Artur; Michael, Maria K.; Raik, Jaan2019 IEEE International Test Conference (ITC)2019 / 4 p https://doi.org/10.1109/ITC44170.2019.9000148 https://www.scopus.com/sourceid/25589 https://www.scopus.com/record/display.uri?eid=2-s2.0-85081583727&origin=inward&txGid=3cc96819b9a7387458a3ba31812d2556 https://www.webofscience.com/wos/woscc/full-record/WOS:000540385000037
• Simulation-based equivalence checking between IEEE 1687 ICL and RTLDamljanovic, Aleksa; Jutman, Artur; Portolan, Michele; Tšertov, Anton2019 IEEE International Test Conference (ITC)2019 / paper. 7.3, 8 p. : ill https://doi.org/10.1109/ITC44170.2019.9000181