Post-silicon validation of IEEE 1687 reconfigurable scan networks
Damljanovic, Aleksa
;
Jutman, Artur
;
Squillero, Giovanni
;
Tšertov, Anton
2019 IEEE European Test Symposium (ETS) : proceedings
2019
/
6 p. : ill
https://doi.org/10.1109/ETS.2019.8791546