SiC-diodes forward surge current failure mechanisms : experiment and simulationUdal, Andres; Velmre, EnnMicroelectronics reliability1997 / p. 1671-1674https://doi.org/10.1016/S0026-2714(97)00136-4
SiC-diodes forward surge current failure mechanisms : experiment and simulationVelmre, Enn; Udal, AndresESREF'97 : proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct. 7-10, 1997, Bordeaux, France1997 / p. 1671-1674https://www.sciencedirect.com/science/article/abs/pii/S0026271497001364