• Impact of orientation on the bias of SRAM-based PUFsAbideen, Zain Ul; Wang, Rui; Perez, Tiago Diadami; Schrijen, Geert-Jan; Pagliarini, Samuel NascimentoIEEE design & test2024 / p. 14-20 https://doi.org/10.1109/MDAT.2023.3322621
• Novel architectures for contractive autoencoders with embedded learningKerner, Madis; Tammemäe, Kalle; Raik, Jaan; Hollstein, Thomas2020 17th Biennial Baltic electronics conference, Tallinn, Estonia, October 6-8, 2020 : proceedings2020 / 6 p. : ill https://doi.org/10.1109/BEC49624.2020.9277246