Computer-aided examination of the I²L current source and the behaviour of the I²L flip-flop used in static memory cells
Rang, Toomas
Periodica polytechnica. Electrical engineering = Электротехника
1981
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p. 159-165 : joon
https://www.ester.ee/record=b1198855*est
https://pp.bme.hu/ee/article/view/4776/3881