• Comparison of multifractal parameters of surface defects and non-defectsMartsepp, Merike; Laas, Tõnu; Tõkke, Siim; Priimets, Jaanis; Mikli, ValdekProceedings of the Estonian Academy of Sciences2023 / p. 115-127 : ill https://doi.org/10.3176/proc.2023.2.03 https://www.scopus.com/sourceid/11500153303 https://www.scopus.com/record/display.uri?eid=2-s2.0-85150883656&origin=inward&txGid=d2fc090324be5e3d2789d205b210eb14 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=P%20EST%20ACAD%20SCI&year=2023 https://www.webofscience.com/wos/woscc/full-record/WOS:000998113400002
• Dependence of multifractal analysis parameters on the darkness of a processed imageMartsepp, Merike; Laas, Tõnu; Laas, Katrin; Priimets, Jaanis; Tõkke, Siim; Mikli, ValdekChaos, Solitons & Fractals2022 / art. 111811 https://doi.org/10.1016/j.chaos.2022.111811 https://www.scopus.com/sourceid/25347 https://www.scopus.com/record/display.uri?eid=2-s2.0-85123586094&origin=inward&txGid=75e82391482599e91d44554c9d605712 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=CHAOS%20SOLITON%20FRACT&year=2022 https://www.webofscience.com/wos/woscc/full-record/WOS:000782110200009
• Erratum: Multifractal analysis of high-temperature plasma irradiated tungsten surfaces (Surface Topography: Metrology and Properties (2021) 9 (035030) DOI: 10.1088/2051-672x/ac1dc3)Martsepp, Merike; Laas, Tõnu; Laas, Katrin; Priimets, Jaanis; Mikli, Valdek; Antonov, MaksimSurface topography : metrology and properties2023 / art. 029501 https://doi.org/10.1088/2051-672X/acc81c https://www.scopus.com/sourceid/21100469364 https://www.scopus.com/record/display.uri?eid=2-s2.0-85153533771&origin=inward&txGid=73d2ca5a67fc96b3f045992fd1e23929 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=SURF%20TOPOGR-METROL&year=2023 https://www.webofscience.com/wos/woscc/full-record/WOS:000967621500001
• Multifractal analysis of high-temperature plasma irradiated tungsten surfacesMartsepp, Merike; Laas, Tõnu; Laas, Katrin; Priimets, Jaanis; Mikli, Valdek; Antonov, MaksimSurface topography : metrology and properties2021 / 13 p. : ill https://doi.org/10.1088/2051-672X/ac1dc3 https://www.scopus.com/sourceid/21100469364 https://www.scopus.com/record/display.uri?eid=2-s2.0-85114650363&origin=inward&txGid=67cd6a7a318485b348cb02413acdfde4 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=SURF%20TOPOGR-METROL&year=2022 https://www.webofscience.com/wos/woscc/full-record/WOS:000691055500001
• Multifractal defects versus non-defects in surface analysisMartsepp, Merike; Laas, Tõnu; Tõkke, Siim; Mikli, ValdekGraduate School of Functional Materials and Technology (GSFMT) Scientific Conference : abstracts2022 / 37 l. https://fmtdk.ut.ee/wp-content/uploads/2022/05/Conference-book-of-abstracts-2022.pdf