DefSim: a remote laboratory for studying physical defects in CMOS digital circuits
Pleskacz, Witold A.
;
Stopjakova, Viera
;
Borejko, Tomasz
;
Jutman, Artur
;
Walkanis, Andrzej
IEEE transactions on industrial electronics
2008
/
6, p. 2405-2415 : ill
https://www.researchgate.net/publication/3219964_DefSim_A_Remote_Laboratory_for_Studying_Physical_Defects_in_CMOS_Digital_Circuits