A survey on UAV computing platforms : a hardware reliability perspective
Ahmed, Foisal
;
Jenihhin, Maksim
Sensors
2022
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art. 6286
https://doi.org/10.3390/s22166286
https://www.scopus.com/sourceid/130124
https://www.scopus.com/record/display.uri?eid=2-s2.0-85136625318&origin=inward&txGid=104823fe2944deb91b3cd11de67100a3
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=SENSORS-BASEL&year=2022
https://www.webofscience.com/wos/woscc/full-record/WOS:000845429300001
Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applications
Cherezova, Natalia
;
Shibin, Konstantin
;
Jenihhin, Maksim
;
Jutman, Artur
Microelectronics reliability
2023
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art. 115010, 10 p. : ill
https://doi.org/10.1016/j.microrel.2023.115010
https://www.scopus.com/sourceid/26717
https://www.scopus.com/record/display.uri?eid=2-s2.0-85159638800&origin=inward&txGid=5c8c991b1cc2020860e81a21c25c1f79
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=MICROELECTRON%20RELIAB&year=2023
https://www.webofscience.com/wos/woscc/full-record/WOS:001001810500001