Critical analysis of uncertainty relations based on signal duration and spectrum width
Udal, Andres
;
Kukk, Vello
;
Velmre, Enn
Elektronika ir elektrotechnika = Electronics and electrical engineering
2009
/
p. 31-34 : ill
https://www.ester.ee/record=b1200105*est
https://eejournal.ktu.lt/index.php/elt/article/view/10098