An approach for verification assertions reuse 2 in RTL test pattern generation
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Viilukas, Taavi
;
Fujiwara, Hideo
Journal of Shanghai Normal University : Natural Sciences
2010
/
p. 441-447 : ill
https://www.researchgate.net/publication/240613999_An_Approach_for_Verification_Assertions_Reuse_in_RTL_Test_Pattern_Generation