• A two-phase metamorphic approach for testing industrial control systemsSudheerbabu, Gaadha; Ahmad, Tanwir; Sebek, Filip; Truscan, Dragos; Vain, Jüri; Porres, Ivan2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA) : proceedings2022 / 4 p https://doi.org/10.1109/ETFA52439.2022.9921439