• Asynchronous fault detection in IEEE P1687 instrument networkShibin, Konstantin; Devadze, Sergei; Jutman, ArturIEEE 23rd North Atlantic Test Workshop : 14-16 May 2014, Binghampton, New York : proceedings2014 / p. 73-78 : ill
• At-speed testing of inter-die connections of 3D-SICs in the presence of shore logicShibin, Konstantin; Chickermane, Vivek; Keller, Brion; Papameletis, Christos; Marinissen, Erik Jan2015 Asian Test Symposium : ATS 2015 : 22-25 November 2015, Mumbai, Maharashtra, India : proceedings2015 / p. 79-84 : ill http://dx.doi.org/10.1109/ATS.2015.21
• CMS drift tubes sector collector relocation phase 1 upgrade [Electronic resource]Bedoya, C. F.; Jutman, Artur; Shibin, Konstantin; Devadze, Sergei2015 http://cms.cern.ch/iCMS/jsp/openfile.jsp?type=DN&year=2015&files=DN2015_011.pdf
• Designing reliable cyber-physical systemsAleksandrowicz, Gadi; Arbel, Eli; Bloem, Roderick; Devadze, Sergei; Jenihhin, Maksim; Jutman, Artur; Raik, Jaan; Shibin, KonstantinLanguages, design methods, and tools for electronic system design : selected contributions from FDL 20162018 / p. 15-38 : ill https://doi.org/10.1007/978-3-319-62920-9_2 https://www.scopus.com/sourceid/19700186822 https://www.scopus.com/record/display.uri?eid=2-s2.0-85034454180&origin=inward&txGid=1919701f932d3cb9cce2393c1329c1e1
• Designing reliable cyber-physical systems : overview associated to the special session at FDL'16Aleksandrowicz, Gadi; Arbel, Eli; Bloem, Roderick; Devadze, Sergei; Jenihhin, Maksim; Jutman, Artur; Raik, Jaan; Shibin, KonstantinThe 2016 Forum on Specification & Design Languages : proceedings : Bremen, Germany, September 14-16, 20162016 / [8] p. : ill https://doi.org/10.1109/FDL.2016.7880382
• Effective scalable IEEE 1687 instrumentation network for fault managementJutman, Artur; Shibin, Konstantin; Devadze, SergeiIEEE design & test2013 / p. 26-35 : ill https://doi.org/10.1109/MDAT.2013.2278535 https://www.scopus.com/sourceid/21100286806 https://www.scopus.com/record/display.uri?eid=2-s2.0-84900025438&origin=resultslist&sort=plf-f&src=s&sot=b&sdt=b&s=DOI%2810.1109%2FMDAT.2013.2278535%29&sessionSearchId=47e771afcc769678348f9a5b62e06fdd&relpos=0 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20DES%20TEST&year=2013 https://www.webofscience.com/wos/woscc/full-record/WOS:000328974800004
• Fault management instrumentation network based on IEEE P1687 IJTAGShibin, Konstantin; Jutman, Artur; Devadze, SergeiEuropean Test Symposium (ETS), 2013, Avignon, France2013
• Health management for self-aware SoCs based on IEEE 1687 infrastructureShibin, Konstantin; Devadze, Sergei; Jutman, Artur; Grabmann, Martin; Pricken, RobinIEEE Design & Test2017 / p. 27-35 : ill https://doi.org/10.1109/MDAT.2017.2750902 https://www.scopus.com/sourceid/21100286806 https://www.scopus.com/record/display.uri?eid=2-s2.0-85037723856&origin=inward&txGid=43952d2af7eb29d9046c148b7fce363e https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20DES%20TEST&year=2017 https://www.webofscience.com/wos/woscc/full-record/WOS:000416261800004
• IEEE 1687 compliant ecosystem for embedded instrumentation access and in-field health monitoringTšertov, Anton; Jutman, Artur; Shibin, Konstantin; Devadze, SergeiIEEE AUTOTESTCON 2018 : National Harbor, September 17-20, 2018 : proceedings2018 / 9 p.: ill https://doi.org/10.1109/AUTEST.2018.8532559
• IEEE P1687 IJTAG demonstrator on FPGAShibin, Konstantin; Aleksejev, Igor; Jutman, Artur; Devadze, SergeiDATE 2012 University Booth : Design Automation and Test in Europe : Dresden, Germany, March 12-16, 20122012 / 1 p. : ill
• Integrated modelling, fault management, verification and reliable design environment for cyber-physical systemsRaik, Jaan; Rauwerda, Gerard; Zhao, Yong; Shibin, KonstantinMEDIAN Finale : Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : November 10-11, 2015, Tallinn, Estonia2015 / p. 74
• Keynote: cost-efficient reliability for Edge-AI chipsJenihhin, Maksim; Taheri, Mahdi; Cherezova, Natalia; Ahmadilivani, Mohammad Hasan; Selg, Hardi; Jutman, Artur; Shibin, Konstantin; Tsertov, Anton; Devadze, Sergei; Kodamanchili, Rama Mounika; Rafiq, Ahsan; Raik, Jaan; Daneshtalab, Masoud2024 IEEE 25th Latin American Test Symposium (LATS)2024 https://doi.org/10.1109/LATS62223.2024.10534610 https://www.scopus.com/record/display.uri?eid=2-s2.0-85195425788&origin=resultslist&sort=plf-f&src=s&sot=b&sdt=b&s=DOI%2810.1109%2FLATS62223.2024.10534610%29&sessionSearchId=03854897c8e6e7bbc8ffad5b01ef8afb&relpos=0
• On-chip sensors data collection and analysis for SoC health managementShibin, Konstantin; Jenihhin, Maksim; Jutman, Artur; Devadze, Sergei; Tsertov, Anton2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)2023 / 6 p https://doi.org/10.1109/DFT59622.2023.10313562
• On-line fault classification and handling in IEEE1687 based fault management system for complex SoCsShibin, Konstantin; Devadze, Sergei; Jutman, ArturLATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 20162016 / p. 69-74 : ill https://doi.org/10.1109/LATW.2016.7483342
• Open-source JTAG simulator bundle for labsShibin, Konstantin; Devadze, Sergei; Rosin, Vjatšeslav; Jutman, Artur; Ubar, Raimund-JohannesInternational journal of electronics and telecommunications2012 / p. 233-239 : ill https://journals.pan.pl/Content/87192/PDF/32.pdf
• Optimization of boundary scan tests using FPGA-based efficient scan architecturesAleksejev, Igor; Devadze, Sergei; Jutman, Artur; Shibin, KonstantinJournal of electronic testing : theory and applications (JETTA)2016 / p. 245-255 : ill https://doi.org/10.1007/s10836-016-5588-y https://www.scopus.com/sourceid/18040 https://www.scopus.com/record/display.uri?eid=2-s2.0-84964452131&origin=inward&txGid=035b6825dd1a37b925ec9c823fcecd7d https://jcr.clarivate.com/jcr-jp/journal-profile?journal=J%20ELECTRON%20TEST&year=2016 https://www.webofscience.com/wos/woscc/full-record/WOS:000377449900002
• Reliable health monitoring and fault management infrastructure based on embedded instrumentation and IEEE 1687Jutman, Artur; Shibin, Konstantin; Devadze, SergeiIEEE AUTOTESTCON 2016 : Anaheim, California, USA, September 12-15, 2016 : proceedings2016 / p. 240-249 : ill https://doi.org/10.1109/AUTEST.2016.7589605
• Special session: in-field ML-assisted intermittent fault localization and management in RISC-V SoCsSelg, Hardi; Shibin, Konstantin; Tsertov, Anton; Jenihhin, Maksim; Ellervee, Peeter; Raik, Jaan2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)2024 https://doi.org/10.1109/DFT63277.2024.10753541 https://www.scopus.com/record/display.uri?eid=2-s2.0-85212426533&origin=resultslist&sort=plf-f&src=s&sot=b&sdt=b&s=DOI%2810.1109%2FDFT63277.2024.10753541%29&sessionSearchId=f890857a41c36254c0f644edbb3c2ac3&relpos=0
• Synchronization, calibration and triggering of IEEE 1687 embedded instrumentsJutman, Artur; Devadze, Sergei; Shibin, KonstantinThe Seventeenth Workshop on RTL and High Level Testing (WRTLT'16) : November 24-25, 2016, Aki Grand Hotel, Hiroshima, Japan2016 / [6] p
• System-wide fault management based on IEEE P1687 IJTAGShibin, Konstantin; Jutman, Artur; Devadze, SergeiInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kuuenda aastakonverentsi artiklite kogumik : 3.-5. oktoobril 2012, Laulasmaa2012 / p. 81-84 : ill
• The CMS fast beam condition monitor for HL-LHCAuzinger, G.; Bakhshiansohi, H.; Dabrowski, A.; Delannoy, A.G.; Dierlamm, A.; Dragicevic, M.; Gholami, A.; Gomez, G.; Jenihhin, Maksim; Shibin, KonstantinJournal of instrumentation2024 / art. C03048, 10 p. : ill https://doi.org/10.1088/1748-0221/19/03/C03048 https://www.scopus.com/sourceid/4900152808 https://www.scopus.com/record/display.uri?eid=2-s2.0-85188347582&origin=resultslist&sort=plf-f&src=s&sot=b&sdt=b&s=TITLE-ABS-KEY%28%22The+CMS+Fast+Beam+Condition+Monitor+for+HL-LHC%22%29&relpos=0 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=J%20INSTRUM&year=2023 https://www.webofscience.com/wos/woscc/full-record/WOS:001189711800006
• The optimization, design and performance of the FBCM23 ASIC for the upgraded CMS beam monitoring systemKaplon, Jan; Wegrzyn, Grzegorz; Shibin, Konstantin; Barendregt, MarnixJournal of instrumentation2024 / art. C02026, 6 p. : ill https://doi.org/10.1088/1748-0221/19/02/C02026 https://www.scopus.com/sourceid/4900152808 https://www.scopus.com/record/display.uri?eid=2-s2.0-85185715697&origin=resultslist&sort=plf-f&src=s&sot=b&sdt=b&s=TITLE-ABS-KEY%28%22The+optimization%2C+design+and+performance+of+the+FBCM23+ASIC+for+the+upgraded+CMS+beam+monitoring+system%22%29&sessionSearchId=2bbe75602bfce151f67e72e233c95154&relpos=0 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=J%20INSTRUM&year=2023 https://www.webofscience.com/wos/woscc/full-record/WOS:001181755600002
• Trainer 1149 : a boundary scan simulation bundle with hardware support for labsShibin, Konstantin; Jutman, ArturInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve2011 / p. 135-138 : ill
• Trainer 1149: a boundary scan simulation bundle for labsJutman, Artur; Ubar, Raimund-Johannes; Devadze, Sergei; Shibin, Konstantin; Rosin, VjatšeslavMIXDES 2011 : 18th International Conference "Mixed Design of Integrated Circuits and Systems" : June 16-18, 2011, Gliwice, Poland2011 / p. 520-525
• Understanding boundary scan test with Trainer 1149Jutman, Artur; Devadze, Sergei; Shibin, Konstantin; Rosin, Vjatšeslav; Ubar, Raimund-Johannes22nd EAEEIE annual conference : June, 13-15, 2011, Maribor, Slovenija : conference book2011 / p. 21-22 https://ieeexplore.ieee.org/document/6165727
• Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applicationsCherezova, Natalia; Shibin, Konstantin; Jenihhin, Maksim; Jutman, ArturMicroelectronics reliability2023 / art. 115010, 10 p. : ill https://doi.org/10.1016/j.microrel.2023.115010 https://www.scopus.com/sourceid/26717 https://www.scopus.com/record/display.uri?eid=2-s2.0-85159638800&origin=inward&txGid=5c8c991b1cc2020860e81a21c25c1f79 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=MICROELECTRON%20RELIAB&year=2023 https://www.webofscience.com/wos/woscc/full-record/WOS:001001810500001
• Virtual reconfigurable scan-chains on FPGAs for optimized board testAleksejev, Igor; Jutman, Artur; Devadze, Sergei; Shibin, Konstantin2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102411