Automatic distribution of local testers for testing distributed systems
Vain, Jüri
;
Halling, Evelin
;
Kanter, Gert
;
Anier, Aivo
;
Pal, Deepak
Databases and information systems IX : selected papers from the twelfth International Baltic Conference, DB&IS 2016
2016
/
p. 297-310 : ill
https://doi.org/10.3233/978-1-61499-714-6-297
https://www.scopus.com/sourceid/19500157321
https://www.scopus.com/record/display.uri?eid=2-s2.0-85030703059&origin=inward&txGid=e2b8d23c3197df5a63dc644219db590d
https://www.webofscience.com/wos/woscc/full-record/WOS:000390305200022