• Beyond the Happy Path : A Safety-Critical Audit Methodology for Estonia’s I-Voting Processing ApplicationTreier, TarvoIEEE Access2025 / p. 203429-203443 : ill https://doi.org//10.1109/ACCESS.2025.3638663
• On the reuse of TLM mutation analysis at RTLGuarnieri, Valerio; Hantson, Hanno; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications2012 / p. 435-448 : ill https://link.springer.com/article/10.1007/s10836-012-5303-6