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• Failure mechanisms in oil-shale pillarsPastarus, Jüri-RivaldoOil shale1994 / 3, p. 251-257: ill https://kirj.ee/wp-content/plugins/kirj/pub/OS-3-1994-251-257_20230316182205.pdf
• Fast extended test access via JTAG and FPGAsDevadze, Sergei; Jutman, Artur; Aleksejev, Igor; Ubar, Raimund-JohannesInternational Test Conference 2009 : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas USA : proceedings2009 / p. 1-7 : ill http://dx.doi.org/10.1109/TEST.2009.5355668
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• Fault aliasing of signature analyzersKemnitz, Günter; Kärger, ReinhardBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 339-346: ill
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• Fault detection and protection system for the power converters with high-voltage IGBTs [Electronic resource]Vinnikov, Dmitri; Roasto, Indrek; Lehtla, TõnuICECS 2008 : The 15th IEEE International Conference on Electronics, Circuits and Systems : August 31 - September 3, 2008, Malta2008 / p. 922-925 : ill. [CD-ROM] https://ieeexplore.ieee.org/document/4675005
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• Fault diagnosis in VLSI devicesUbar, Raimund-JohannesProceedings of the Estonian Academy of Sciences. Engineering1995 / 1, p. 51-67
• Fault diagnosis of additional vibration in Cartesian robotAutsou, Siarhei21st International Symposium "Topical problems in the field of electrical and power engineering. Doctoral school of energy and geotechnology. III" : Pärnu, Estonia, June 15-18, 20222022 / p. 21-22 : ill https://www.ester.ee/record=b5504019*est
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• Fault emulation on FPGA : a feasibility studyEllervee, Peeter; Raik, Jaan; Tihhomirov, ValentinIEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings2003 / p. 92-95 : ill https://www.researchgate.net/publication/246171898_Fault_Emulation_on_FPGA_A_Feasibility_Study
• Fault locating in unearthed MV networks based on analysis of wave transientsJärvik, Jaan; Panov, ValeriThe 4th International Conference Electric Power Quality and Supply Reliability : August 29...31, 2004, Pedase, Estonia : proceedings2004 / p. 163-168
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• Fault modeling and diagnosis in digital systemsUbar, Raimund-JohannesCREDES Summer School : Dependable Systems Design : handouts2011 / p. 91-106 : ill
• Fault path detection using a spectral methodPorwik, PiotrBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 315-318: ill
• Fault prediction in power networkKangilaski, TaivoThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 289-292
• Fault simulation and analysis of high-voltage circuit breaker's spring charging mechanism using a universal motor modelAsad, Bilal; Vaimann, Toomas; Kallaste, Ants; Kilter, Jako; Sardar, Muhammad Usman2024 IEEE 65th International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON)2024 / 5 p https://doi.org/10.1109/RTUCON62997.2024.10830846
• Fault simulation of digital systems = Digitaalsüsteemide rikete simuleerimineDevadze, Sergei2009 https://digi.lib.ttu.ee/i/?445 https://www.ester.ee/record=b2508727*est
• Fault simulation with parallel critical path tracing for combinational circuits using structurally synthesized BDDsDevadze, Sergei; Raik, Jaan; Jutman, Artur; Ubar, Raimund-Johannes7th IEEE Latin American Test Workshop LATW'06 : Buenos Aires, Argentina, March 26th-29th, 2006 : proceedings2006 / p. 97-102 : ill
• Fault simulation with parallel exact critical path tracing in multiple core environmentGorev, Maksim; Ubar, Raimund-Johannes; Devadze, SergeiProceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE) : 9-13 March 2015, Grenoble, France2015 / p. 1180-1185 : ill
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• Fault-resilient NoC router with transparent resource allocationPutkaradze, Tsotne; Azad, Siavoosh Payandeh; Niazmand, Behrad; Raik, Jaan; Jervan, Gert12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings2017 / 8 p. : ill https://doi.org/10.1109/ReCoSoC.2017.8016161 https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8016161
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• FPGA based fault emulation of synchronous sequential circuitsEllervee, Peeter; Raik, Jaan; Tihhomirov, Valentin; Ubar, Raimund-JohannesProceedings [of] 22nd NORCHIP Conference : Oslo, Norway, 8-9 November 20042004 / p. 59-62 https://ieeexplore.ieee.org/abstract/document/1423822
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• A framework for combining concurrent checking and online embedded test for low-latency fault detection in NoC routersSaltarelli, Pietro; Niazmand, Behrad; Raik, Jaan; Govind, Vineeth; Hollstein, Thomas; Jervan, Gert; Hariharan, RanganathanNOCS '15 : International Symposium on Networks-on-Chip : Vancouver, BC, Canada, September 28-30, 20152015 / [8] p. : ill http://dx.doi.org/10.1145/2786572.2788713
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• Generation of tests for the localization of single gate design errors in combinational circuits using the stuck-at fault modelUbar, Raimund-Johannes; Borrione, DominiqueXI Brasilian Symposium on Integrated Circuit Design, September 30 - October 3, 1998, Rio de Janeiro, Brazil : proceedings1998 / p. 51-54 https://ieeexplore.ieee.org/document/715409
• Guardbands in random testingKemnitz, GünterBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 85-88: ill
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• Harmonic spectrum analysis of induction motor with broken rotor bar faultAsad, Bilal; Vaimann, Toomas; Kallaste, Ants; Belahcen, Anouar59th Annual International Scientific Conference on Power and Electrical Engineering : November 12, 13, 2018, Riga Technical University (RTUCON) : conference proceedings2018 / 7 p. : ill https://doi.org/10.1109/RTUCON.2018.8659842
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• High-level modeling and testing of multiple control faults in digital systemsJasnetski, Artjom; Oyeniran, Adeboye Stephen; Tšertov, Anton; Schölzel, Mario; Ubar, Raimund-JohannesFormal proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 20-22, 2016, Košice, Slovakia2016 / [6] p. : ill http://dx.doi.org/10.1109/DDECS.2016.7482445
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• Holistic approach for Fault-Tolerant Network-on-Chip based many-core systems [Online resource]Azad, Siavoosh Payandeh; Niazmand, Behrad; Raik, Jaan; Jervan, Gert; Hollstein, ThomasarXiv.org2016 / [8] p. : ill
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• Identification and location of PD defects in medium voltage underground power cables using high frequency current transformerShafiq, Muhammad; Kiitam, Ivar; Taklaja, Paul; Kütt, Lauri; Kauhaniemi, Kimmo; Palu, IvoIEEE Access2019 / art. 8771171, p. 103608 - 103618 : ill https://doi.org/10.1109/ACCESS.2019.2930704 https://www.scopus.com/sourceid/21100374601 https://www.scopus.com/record/display.uri?eid=2-s2.0-85078696675&origin=inward&txGid=f2cd5a0c1fdafb686a0f00f9d0e590c8 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20ACCESS&year=2022 https://www.webofscience.com/wos/woscc/full-record/WOS:000481692100021
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• Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]Ubar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE2013 / p. 36-41 : ill [CD-ROM]
• A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseksBalakrishnan, Aneesh2022 https://doi.org/10.23658/taltech.11/2022 https://digikogu.taltech.ee/et/Item/a594d3ec-0e6b-4a78-819a-fe1f47992612
• System modelling and measurement under the view of design of testability and fault diagnosis of analog circuitsLiu, Ji-Gou; Frühauf, UweBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 295-298: ill
• Teaching diagnostic modeling of digital systems with decision diagrams [Electronic resource]Ubar, Raimund-Johannes; Raik, Jaan; Mironov, Dmitri; Evartson, Teet; Orasson, Elmet; Aarna, Margit; Wuttke, Heinz-DietrichProceedings of 12th IASTED International Conference on Computers and Advanced Technology in Education - CATE 2009 : St.Thomas, US, November 22-24, 20092009 / p. 1-6. [CD-ROM]
• Teaching digital system testOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Kruus, MargusThe 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble2017 / [6] p
• Techniques for robust routing, communication and computation in multiprocessor systems = Robustse marsruutimise, side ja arvutuse tehnikad mitmeprotsessorilistes süsteemidesJanson, Karl2021 https://www.ester.ee/record=b5396084*est https://digikogu.taltech.ee/et/Item/c9091d5c-dcd8-4b21-95a7-84ead85241e6 https://doi.org/10.23658/taltech.3/2021
• Tehisintellekt pandi metalliettevõttes rikkeid otsima, et vähendada tootmiskulusid [Võrguväljaanne]am.ee2022 https://www.am.ee/node/8498
• Test configurations for diagnosing faulty links in NoC switchesRaik, Jaan; Ubar, Raimund-Johannes; Govind, Vineeth12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings2007 / p. 29-34 : ill http://dx.doi.org/10.1109/ETS.2007.41
• Test configurations for diagnosing faulty links in NoC switchesRaik, Jaan; Ubar, Raimund-Johannes; Govind, VineethInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 33-37 : ill
• Test generation for control faults in digital systemsDušina, Julia; Brik, MarinaBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 325-330: ill
• Test generation for finite state machinesUbar, Raimund-Johannes; Brik, MarinaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 233-236: ill
• Test methods for crosstalk-induced delay and glitch faults in network-on-chip interconnects implementing asynchronous communication protocolsBengtsson, Tomas; Kumar, Shashi; Ubar, Raimund-Johannes; Jutman, Artur; Peng, ZeboIET computers and digital techniques2008 / 6, p. 445-460 https://www.diva-portal.org/smash/record.jsf?dswid=-5073&aq2=%5B%5B%5D%5D&c=39&af=%5B%5D&searchType=SIMPLE&sortOrder2=title_sort_asc&language=en&pid=diva2%3A290043&aq=%5B%5B%7B%22personId%22%3A%22authority-person%3A23389%22%7D%5D%5D&sf=all&aqe=%5B%5D&sortOrder=author_sort_asc&onlyFullText=false&noOfRows=50
• Test pattern generation at the behavioral level from VHDL circuit description containing several processesGramatova, Elena; Bezakova, Jana; Cibakova, TatianaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 145-148
• Testing of systems using softwareUbar, Raimund-JohannesConcise encyclopedia of software engineering1993 / p. 352-356
• The analysis of integrating sigma-delta ADC noiseGutnikov, V.S.; Krivchenko, T.I.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 201-206: ill
• The FEM based modeling and corresponding test rig preparation for broken rotor bars analysisAsad, Bilal; Eensalu, Lauri; Vaimann, Toomas; Kallaste, Ants; Rassõlkin, Anton; Belahcen, Anouar2019 IEEE 60th International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON), 7-9 October 2019 : conference proceedings2019 / 9 p. : ill https://doi.org/10.1109/RTUCON48111.2019.8982350
• The investigation of the Therac-25 accidentsZdanov, VassiliA & A2007 / 6, lk. 20-32 : ill https://artiklid.elnet.ee/record=b1021179*est
• The study about indefinite fault causes in Estonian 110 kV power gridTaklaja, Paul; Oidram, ReinPQ2010 : 7th International Conference "2010 Electric Power Quality and Supply Reliability" : June 16-18, 2010, Kuressaare, Estonia2010 / p. 177-182 : ill
• 3D parallel fault simulationGorev, Maksim; Ubar, Raimund-JohannesProceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere2014 / p. 39-42 : ill
• 3D permeance model of induction machines taking into account saturation effects and its connection with stator current and shaft speed spectraMartinez, Javier; Belahcen, Anouar; Arkkio, AnteroIET electric power applications2015 / p. 20-29 : ill http://dx.doi.org/10.1049/iet-epa.2014.0013
• A tool for random test generation targeting high diagnostic resolutionOsimiry, Emmanuel Ovie; Kostin, Sergei; Raik, Jaan; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 79-82 : ill http://www.ester.ee/record=b2150914*est
• A tool set for teaching design-for-testability of digital circuitsKostin, Sergei; Orasson, Elmet; Ubar, Raimund-JohannesEWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK2016 / [6] p. : ill https://doi.org/10.1109/EWME.2016.7496466
• Topological analysis of SSBDDs with applications in fault diagnosisUbar, Raimund-JohannesProceedings of 10th International Workshop on Boolean Problems : Freiberg, Germany, September 19-21, 20122012 / p. 1-16
• Towards artificial intelligence based automatic adaptive response analyzer for high frequency analog BISTPetlenkov, Eduard; Jutman, Artur; Nõmm, Sven; Ubar, Raimund-JohannesCIMSA 2008 : IEEE International Conference on Computational Intelligence for Measurement Systems and Applications : Istanbul, Turky, July 14-16, 20082008 / p. 99-104 : ill https://ieeexplore.ieee.org/document/4595841
• Transient modeling and recovery of non-stationary fault signature for condition monitoring of induction motorsAsad, Bilal; Vaimann, Toomas; Belahcen, Anouar; Kallaste, Ants; Rassõlkin, Anton; Ghahfarokhi, Payam Shams; Kudelina, KarolinaApplied sciences2021 / 17 p. : ill https://doi.org/10.3390/app11062806 https://www.scopus.com/sourceid/21100829268 https://www.scopus.com/record/display.uri?eid=2-s2.0-85103498167&origin=inward&txGid=d1f970967339399f05005531cb5016ff https://jcr.clarivate.com/jcr-jp/journal-profile?journal=APPL%20SCI-BASEL&year=2022 https://www.webofscience.com/wos/woscc/full-record/WOS:000645822500001
• Transient modeling and recovery of non-stationary fault signature for condition monitoring of induction motorsAsad, Bilal; Vaimann, Toomas; Belahcen, Anouar; Kallaste, Ants; Rassõlkin, Anton; Ghahfarokhi, Payam ShamsAdvances in machine fault diagnosis2022 / p. 43-59 https://doi.org/10.3390/app11062806
• Transition delay fault simulation with parallel critical path back-tracing and 7-valued algebraKõusaar, Jaak; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, JaanMicroprocessors and microsystems2015 / p. 1130-1138 : ill http://dx.doi.org/10.1016/j.micpro.2015.05.003
• Troubleshooting and debugging functionsRuban, Olga; Laugis, Juhan5th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology : Kuressaare, January 14-19, 20082008 / p. 216-221 : ill
• Troubleshooting process analysis and development of application for decision making enhancementMahmood, Kashif; Ševtšenko, Eduard; Karaulova, Tatjana; Branten, Eva; Maleki, Meysam26th DAAAM International Symposium on Intelligent Manufacturing and Automation 2015 (DAAAM 2015) : Zadar, Croatia, 21-24 October 2015. Volume 12016 / p. 0663-0671 : ill http://dx.doi.org/10.2507/26th.daaam.proceedings.090
• A 2D FEM model for transient and fault analysis of induction machinesMartinez, Javier; Belahcen, Anouar; Arkkio, AnteroPrzeglad elektrotechniczny = Electrical review2012 / p. 157-160 : ill http://pe.org.pl/articles/2012/7b/41.pdf
• Tõrked, vead ja rikked ning süsteemide usaldusväärsusPaluoja, Rein; Petermann, ViktorA & A1998 / 3, lk. 16-21: ill
• Ultra fast parallel fault analysis on structurally synthesized BDDsUbar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan; Jutman, Artur12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings2007 / p. 131-136 : ill http://dx.doi.org/10.1109/ETS.2007.43
• Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applicationsCherezova, Natalia; Shibin, Konstantin; Jenihhin, Maksim; Jutman, ArturMicroelectronics reliability2023 / art. 115010, 10 p. : ill https://doi.org/10.1016/j.microrel.2023.115010 https://www.scopus.com/sourceid/26717 https://www.scopus.com/record/display.uri?eid=2-s2.0-85159638800&origin=inward&txGid=5c8c991b1cc2020860e81a21c25c1f79 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=MICROELECTRON%20RELIAB&year=2023 https://www.webofscience.com/wos/woscc/full-record/WOS:001001810500001
• Understanding MPSoCs : exploiting memory microarchitectural vulnerabilities of high performance NoC-based MPSoCsSepulveda, Johanna; Azad, Siavoosh Payandeh; Niazmand, Behrad; Jervan, GertSAMOS '18 : Proceedings of the 18th International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation, Pythagorion, Greece, July 15-19, 20182018 / p. 162-166 https://doi.org/10.1145/3229631.3239367 https://www.scopus.com/sourceid/11600154611 https://www.scopus.com/record/display.uri?eid=2-s2.0-85060980987&origin=inward&txGid=68709143f1ddabf77bcd667ba7968b24 https://www.webofscience.com/wos/woscc/full-record/WOS:000475843000021
• Untestable fault identification in sequential circuits using model-checkingRaik, Jaan; Fujiwara, Hideo; Ubar, Raimund-Johannes; Krivenko, AnnaProceedings of the 17th Asian Test Symposium ATS 2008 : November 24-27, 2008, Sapporo, Japan2008 / p. 21-26 : ill http://dx.doi.org/10.1109/ATS.2008.22
• Untestable fault identification in sequential circuits using model-checkingRaik, Jaan; Fujiwara, Hideo; Ubar, Raimund-Johannes; Krivenko, Anna2002-2011 : 20th Anniversary compendium of papers from Asian Test Symposium2011 / p. 257-262 : ill https://ieeexplore.ieee.org/document/4711554
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• Validation of full-converter wind power plant generic model based on actual fault ride-through measurementsTšernobrovkin, Oleg; Perdana, Abram; Palu, Ivo; Kilter, JakoJournal of energy and power engineering2010 / 4, p. 54-62
• Web-based framework for parallel distributed test [Electronic resource]Ivask, Eero; Raik, Jaan; Ubar, Raimund-Johannes2008 IEEE Design and Diagnostics of Electronic Circuits and Systems : Bratislava, Slovakia, April 16-18, 20082008 / p. 271-274 : ill. [CD-ROM] https://ieeexplore.ieee.org/document/4538800
• Veepuhastusjaama juurdevoolukanalis toimunud avarii põhjustestJaaniso, ValdoEhitaja1998 / lk. 86-87, 89: ill https://www.ester.ee/record=b1072123*est
• Verification of a wind farm aggregated generic dynamic model based on a real fault ride-through test in the gridTšernobrovkin, Oleg; Perdana, Abram; Palu, Ivo; Kilter, JakoProceedings of 5th Nordic Wind Power Conference 20092009 / [6] p https://research.chalmers.se/en/publication/97817
• Vibration and stator current spectral analysis of induction machine operating under dynamic eccentricitySobra, Jan; Belahcen, Anouar; Vaimann, Toomas2015 International Conference on Electrical Drives and Power Electronics (EDPE) : 18th International Conference, 7th Joint Slovakian-Croatian Conference : proceedings : Hotel Slovan, Tatranska Lomnica, The High Tatras, Slovakia, September 21-23, 20152015 / p. 285-290 : ill http://dx.doi.org/10.1109/EDPE.2015.7325307
• Vibration as fault indicator in electrical machinesFarzam Far, Mehrnaz; Belahcen, Anouar; Arkkio, Antero; Roivainen, JanneDoctoral School of Energy and Geotechnology II : closing conference of the project : Pärnu, Estonia, January 12-17, 20152015 / p. 120-125 : ill
• Winding function based analytical model of squirrel cage induction motor for fault diagnosticsAsad, Bilal; Vaimann, Toomas; Kallaste, Ants; Rassõlkin, Anton; Belahcen, Anouar2019 26th International Workshop on Electric Drives : Improvement in Efficiency of Electric Drives (IWED) : Moscow Power Engineering Institute, Moscow, Russia, 30th of January - 2nd of February 2019 : proceedings2019 / 6 p. : ill https://doi.org/10.1109/IWED.2019.8664314
• Диагностика кратных неисправностей в комбинационных схемахViilup, Agu; Ubar, Raimund-Johannes; Heiter, U.Труды по электротехнике и автоматике : сборник статей. 111973 / с. 89-94 : илл https://www.ester.ee/record=b2190624*est https://digikogu.taltech.ee/et/Item/d6e57925-e104-44e1-a218-c5b3110d9996
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• Индикатор неисправности ламп ближнего света в автомобилеGavrilov, AlekseiРадиолюбитель2016 / с. 11
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• Минимизация ошибок в лазерном рециркуляционном дальномереZahharov, Boriss; Krusell, UrmasТезисы докладов III Всесоюзной конференции "Применение лазеров в технологии и системах передачи и обработки информации", 11-13 ноября 1987 г. 3, Лазерные системы передачи и обработки информации1987 / с. 25 https://www.ester.ee/record=b1273195*est
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• Построение тестов для неисправностей комбинационных схем на основе анализа ортогональных дизъюнктивных нормальных форм, представляемых альтернативными графамиMatrosova, A.Yu.; Pleshkov, A.G.; Ubar, Raimund-JohannesАвтоматика и телемеханика2005 / с. 158-174 : ил http://mi.mathnet.ru/at1333
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