• Techniques for reliability in Edge-AI chipsJenihhin, Maksim; Taheri, Mahdi; Cherezova, Natalia; Ahmadilivani, Mohammad Hasan; Rafiq, Ahsan; Raik, Jaan; Daneshtalab, MasoudIEEE Top Picks in Test and Reliability Workshop at the International Test Conference 2024, San Diego, US, November 7-8, 20242024 / p. 1-2 https://people.rennes.inria.fr/Marcello.Traiola/TPTR2024/event_program.html