IJTAG-compatible symptom-based SEU monitors for FPGA DNN accelerators
Cherezova, Natalia
;
Jenihhin, Maksim
;
Jutman, Artur
2024 IEEE International Conference on Design, Test and Technology of Integrated Systems (DTTIS)
2024
/
6 p. : ill
https://doi.org/10.1109/DTTIS62212.2024.10780417
https://www.scopus.com/pages/publications/85214972948?origin=resultslist
https://www.webofscience.com/wos/woscc/full-record/WOS:001468545500035