• Complex simulation of punchthrough, tunneling and high-speed characteristics of scaled bipolar devices and circuitsBubennikov, Alexander N.; Ishevsky, D.V.Automation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 26-31: ill https://www.ester.ee/record=b1064031*est