• Efficient hierarchical approach to test generation for digital systemsUbar, Raimund-Johannes; Raik, JaanIEEE ISQED 2000 : proceedings of the IEEE 2000 1st International Symposium on Quality Electronic Design : March 20-22, 2000, San Jose, California2000 / p. 189-195 : ill https://ieeexplore.ieee.org/document/838873