Energy minimization for hybrid BIST in a system-on-chip test environment
Ubar, Raimund-Johannes
;
Shchenova, Tatjana
;
Jervan, Gert
;
Peng, Zebo
European Test Symposium : ETS 2005 : 22-25 May 2005, Tallinn, Estonia : proceedings
2005
/
p. 2-7 : ill