• Ultra-low latency NoC testing via pseudo-random test pattern compactionTatenguem, Herve; Govind, Vineeth; Raik, JaanSoC 2012 : International Symposium on System-on-Chip 2012 : Tampere, Finland, October 11-12, 20122012 / 6 p. : ill https://ieeexplore.ieee.org/document/6376370