• Functional built-in self-test for processor cores in SoCUbar, Raimund-Johannes; Indus, Viljar; Kalmend, Oliver; Evartson, Teet; Orasson, Elmet30th IEEE NORCHIP Conference : Copenhagen, Denmark, November 12-14, 20122012 / p. 1-4 : ill https://ieeexplore.ieee.org/document/6403148