TalTech publikatsioonid
pealdis Govind, V., Raik, J.
maakood us
autor Govind, Vineeth
Raik, Jaan
pealkiri Design-for-testability for application of external test patterns in a NoC
vastutusandmed V.Govind, J.Raik
allikas 2nd Workshop on Diagnostic Services in Network-on-Chips - Test, Debug, and On-Line Monitoring, in conjunction with Design Automation Conference (DAC)
ilmumiskoht Anaheim
ilmumisaasta 2008
leheküljed [4] p