TalTech publikatsioonid
pealdis Velmre, E., Udal, A.
maakood us
keel inglise
autor Velmre, Enn
Udal, Andres
pealkiri Measurements of charge carrier lifetime temperature dependence in 4H-SiC power diodes
vastutusandmed Enn Velmre, Andres Udal
allikas Abstracts of International Conference on Silicon Carbide and Related Materials : ICSCRM'99 : October 10-15, 1999, Research Triangle Park, North-Carolina, USA
ilmumiskoht [S.l.]
ilmumisaasta [1999]
leheküljed paper no 394, 2 p