Software-based self-test generation for microprocessors with high-level decision diagrams
author
Ubar, Raimund-Johannes
Tšertov, Anton
Jasnetski, Artjom
Brik, Marina
statement of authorship
Raimund Ubar, Anton Tsertov, Artjom Jasnetski, Marina Brik
source
LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014
location of publication
[S.l.]
publisher
IEEE
year of publication
2014
pages
[6] p. : ill
conference name, date
15th IEEE Latin-American Test Workshop, March 12-15, 2014
conference location
Fortaleza, Brazil
subject term
mikroprotsessorid
testimine
otsustusdiagrammid
programmigeneraatorid
keyword
microprocessor
software-based self-test (SBST)
test program generation
high-level decision diagrams
ISBN
978-1-4799-4711-9
notes
Bibliogr.: 22 ref
TalTech department
arvutitehnika instituut
language
inglise