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A knowledge-based approach to the specification-based program testingTepandi, JaakComputers and artificial intelligence = Вычислительные машины и искуственный интеллект = Pocitace a umela inteligencia1988 / p. 39-48 https://www.ester.ee/record=b1482459*est

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A new approach to build a low-level malicious fault list starting from high-level description and alternative graphsBenso, A.; Prinetto, Paolo; Rebaudengo, M.; Sonza, M.; Ubar, Raimund-JohannesProceedings IEEE European Design & Test Conference, Paris, March 17-20, 19971997 / p. 560-565 https://ieeexplore.ieee.org/document/582417

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A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est

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A new testability calculation method to guide RTL test generationRaik, Jaan; Nõmmeots, Tanel; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications2005 / p. 71-82 : ill https://doi.org/10.1007/s10836-005-5288-5

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A PC-based CAD system for training digital testUbar, Raimund-Johannes; Buldas, Ahto; Paomets, Priidu; Raik, Jaan; Tulit, ViljarThe Fifth EUROCHIP Workshop on VLSI Design Training, 17-18-19 October 1994, Dresden, Germany1994 / p. 152-157: ill

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A proposal for optimisation of low-powered FSM testingBrik, Marina; Fomina, Jelena; Ubar, Raimund-JohannesProceedings of IEEE East-West Design & Test Workshop (EWDTW'05) : Odessa, Ukraine, September 15-19, 20052005 / p. 15-20

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A scalable static test set compaction method for sequential circuitsAleksejev, Igor; Raik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesProceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico2008 / p. 87-92 : ill

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A study of the toxicity of the ozonation products of phenols and chlorophenols by daphnia magna testTrapido, Marina; Veressinina, Jelena23rd Estonian Chemistry Days : abstracts of scientific conference1997 / p. 152

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A synthesis-agnostic behavioral fault model for high gate-level fault coverageKarputkin, Anton; Raik, Jaan2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) : proceedings2016 / p. 1124-1127 : ill https://ieeexplore.ieee.org/document/7459477/figures#figures

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A testing strategy for interacting finite state machinesYevtushenko, Nina; Petrenko, Alexandre; Trenkaev, VadimBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 137-140: ill

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About robustness of test patterns regarding multiple faultsUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanLATW 2012 : 13th IEEE Latin-American Test Workshop proceedings : April 10th-13th, 2012, Quito, Ecuador2012 / p. 86-91 : ill https://www.infona.pl/resource/bwmeta1.element.ieee-art-000006261243

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Abrasivity study of materials used at abrasive testsKulu, Priit; Veinthal, Renno; Käerdi, Helmo; Tarbe, RihoTribology 2008 : proceedings of the 9th International Tribology Conference : University of Pretoria, South Africa, 2-4 April 20082008 / p. 3.4(1)-3.4(10)

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journal article EST / journal article ENG

Adaptive Extended Kalman Filter position estimation based on Ultra-Wideband Active-Passive Ranging ProtocolLaadung, Taavi; Ulp, Sander; Fjodorov, Aleksei; Alam, Muhammad Mahtab; Le Moullec, YannickIEEE Access2023 / p. 92575-92588 https://doi.org/10.1109/ACCESS.2023.3308696 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

14

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Advances in moving speaker acoustic localization for operation in distributed systemsAstapov, Sergei; Berdnikova, Julia; Preden, Jürgo-SörenInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 9-12 : ill

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AG-model for design of testable controllersKasirova, LiliaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 303-306: ill

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book article EST / book article ENG

Air change efficiency of room ventilation unitsMikola, Alo; Rehand, Juhan; Kurnitski, JarekE3S Web of Conferences : CLIMA 2019 Congress, Bucharest, Romania, May 26-29, 20192019 / art. 01017, 8 p https://doi.org/10.1051/e3sconf/201911101017 Conference proceedings at Scopus Article at Scopus

book article EST / book article ENG

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Ventilation performance in deep renovation of multifamily apartment buildings = Terviklikult renoveeritud korterelamute ventilatsioonisüsteemide toimivus

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Algorithms of functional level testability analysis for digital circuitsUbar, Raimund-Johannes; Kuchcinski, KtzysztofPeriodica polytechnica. Electrical engineering1992 / 3/4, p. 295-308

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Alternative graphs as a mathematical tool and knowledge representation for diagnosis purposes in digital systemsUbar, Raimund-JohannesBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 285-292: ill

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An approach for PSL assertion coverage analysis with high-level decision diagramsJenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes; Shchenova, TatjanaProceedings of IEEE East-West Design & Test Symposium (EWDTS'10) : St. Petersburg, Russia, September 17-20, 20102010 / p. 13-16 : ill https://ieeexplore.ieee.org/document/5742048

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An approach for verification assertions reuse in RTL test pattern generationJenihhin, Maksim; Raik, Jaan; Fujiwara, Hideo; Ubar, Raimund-Johannes; Viilukas, TaaviDigest of papers : IEEE 11th Workshop on RTL and High Level Testing : WRTLT'10 : December 5-6, 2010, Shanghai, China2010 / p. 107-110 : ill

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An approach to model development for embedded testingTimohovich, E.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 353-358

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An aspect-oriented technique to model-based test designSarna, KülliInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kuuenda aastakonverentsi artiklite kogumik : 3.-5. oktoobril 2012, Laulasmaa2012 / p. 77-80

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An automatic test generation system for microprocessor VLSIKont, ToomasМашинное проектирование электронных устройств и систем1989 / p. 104-113

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An educational environment for digital testing : hardware, tools, and web-based runtime platformJutman, Artur; Raik, Jaan; Ubar, Raimund-Johannes; Vislogubov, VladislavProceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 20052005 / p. 412-419 : ill https://www.researchgate.net/profile/Artur-Jutman/publication/220880167_An_Educational_Environment_for_Digital_Testing_Hardware_Tools_and_Web-Based_Runtime_Platform/links/02e7e53c3c71b0b2a7000000/An-Educational-Environment-for-Digital-Testing-Hardware-Tools-and-Web-Based-Runtime-Platform.pdf

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An external test approach for network-on-a-chip switchesRaik, Jaan; Govind, Vineeth; Ubar, Raimund-JohannesATS '06 : Proceedings of the 15th Asian Test Symposium : November 20-23, 2006, Fukuoka, Japan2006 / p. 437-442 : ill http://dx.doi.org/10.1109/ATS.2006.23

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