VHDL based test generation system
                                            statement of authorship
                                    
                                    
G. Jervan, A. Markus, J. Raik, R. Ubar
                                                    
                                            
                                            location of publication
                                    
                                    
Brno
                                                    
                                            
                                            year of publication
                                    
                                    
                                
                                            pages
                                    
                                    
p. 145-148
                                                    
                                            
                                            language
                                    
                                    
inglise
                                                    
                                            
                            Jervan, G., Markus, A., Raik, J., Ubar, R. VHDL based test generation system // Proceedings of the 5th Electronic Devices and Systems Conference, Brno, June 11-12, 1998. Brno : Technical University, Faculty of Electrical Engineering and Computer Science, 1998. p. 145-148.