A new measure for calculating multiple fault coverage of microprocessor self-test
author
Oyeniran, Adeboye Stephen
Odozi, Uzochukwu Eddie
Ubar, Raimund-Johannes
statement of authorship
Adeboye Stephen Oyeniran, Uzochukwu Eddie Odozi, Raimund Ubar
source
BEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia
location of publication
Tallinn
publisher
Tallinn University of Technology
year of publication
2016
pages
p. 75-78 : ill
conference name, date
2016 15th Biennial Baltic Electronics Conference, October 3-5, 2016
conference location
Tallinn, Tallinn University of Technology
url
http://www.ester.ee/record=b2150914*est
subject term
riistvara
mikroprotsessorid
testimine
rikked
keyword
microprocessors
control fault models
test program generation
high-level fault simulation
software-based self-test
ISBN
978-1-5090-1392-0
notes
Bibliogr.: 14 ref
TTÜ department
arvutitehnika instituut
language
inglise