Measures of Impact and Confounding – An Analysis and Experimental Comparison of Novel and Established Measures = Mõju ja segajate mõõdikud – uute ja väljakujunenud meetmete analüüs ja eksperimentaalne võrdlus
author
supervisor
statement of authorship
Sijo Arakkal Peious ; [supervisor: Dirk Draheim ; Tallinn University of Technology, School of Information Technologies, Department of Software Science]
type of dissertation
doktoritöö
university/scientific institution
Tallinna Tehnikaülikool
location of publication
Tallinn
publisher
year of publication
pages
211 p. : ill
series
Tallinn University of Technology. Doctoral thesis = Tallinna Tehnikaülikool. Doktoritöö ; 24/2025
subject term
subject of form
ISSN
2585-6898
2585-6901 (PDF)
ISBN
978-9916-80-290-8 (PDF)
978-9916-80-289-2
notes
Autori publikatsioonide nimekiri leheküljel 7
Bibliograafia lehekülgedel 114-133
Kokkuvõte eesti keeles
Kättesaadav ka võrguteavikuna
Autori CV inglise ja eesti keeles, lk. 207-210
Thesis (Ph.D. (Computer Science)) : Tallinn University of Technology, 2025
url
Open Access
Open Access
scientific publication
teaduspublikatsioon
classifier
TalTech department
language
inglise
- Grand reports : a tool for generalizing association rule mining to numeric target values
- Enabling sensemaking and trust in communities : an organizational perspective
- On observing patterns of correlations during drill-down
- On Choosing the Columnar In-Memory Database Hyrise as High-Performant Implementation Platform for the Grandreport Tool
- On Measuring Confounding Bias in Mixed Multidimensional Data
Arakkal Peious, S. Measures of Impact and Confounding – An Analysis and Experimental Comparison of Novel and Established Measures = Mõju ja segajate mõõdikud – uute ja väljakujunenud meetmete analüüs ja eksperimentaalne võrdlus. Tallinn : TalTech Press, 2025. 211 p. : ill. (Tallinn University of Technology. Doctoral thesis = Tallinna Tehnikaülikool. Doktoritöö ; 24/2025). https://www.ester.ee/record=b5745850*est https://digikogu.taltech.ee/et/Item/81726e4a-6f3a-429b-8580-ae7710da881d https://doi.org/10.23658/taltech.24/2025