On Measuring Confounding Bias in Mixed Multidimensional Data
author
statement of authorship
Sijo Arakkal Peious, Minakshi Kaushik, Syed Attique Shah, Rahul Sharma, Shweta Suran and Dirk Draheim
source
ICT for Intelligent Systems : proceedings of ICTIS 2024. Vol. 6
location of publication
Singapore
publisher
year of publication
pages
p. 329–342
series
Lecture notes in networks and systems ; 1112
conference name, date
ICTIS’2024 – the 8th International Conference on ICT for Intelligent Systems
conference location
Ahmedabad, India
ISBN
978-981-97-6683-3
978-981-97-6684-0
notes
Bibliogr.: 32 ref
scientific publication
teaduspublikatsioon
TalTech department
language
inglise
subject term
classifier
Arakkal Peious, S., Kaushik, M., Shah, S.A., Sharma, R., Suran, S., Draheim, D. On Measuring Confounding Bias in Mixed Multidimensional Data // ICT for Intelligent Systems : proceedings of ICTIS 2024. Vol. 6. Singapore : Springer, 2024. p. 329–342. (Lecture notes in networks and systems ; 1112). https://doi.org/10.1007/978-981-97-6684-0_27