On Measuring Confounding Bias in Mixed Multidimensional Data

statement of authorship
Sijo Arakkal Peious, Minakshi Kaushik, Syed Attique Shah, Rahul Sharma, Shweta Suran and Dirk Draheim
source
ICT for Intelligent Systems : proceedings of ICTIS 2024. Vol. 6
location of publication
Singapore
publisher
year of publication
pages
p. 329–342
series
Lecture notes in networks and systems ; 1112
conference name, date
ICTIS’2024 – the 8th International Conference on ICT for Intelligent Systems
conference location
Ahmedabad, India
ISBN
978-981-97-6683-3
978-981-97-6684-0
notes
Bibliogr.: 32 ref
scientific publication
teaduspublikatsioon
TalTech department
language
inglise
Arakkal Peious, S., Kaushik, M., Shah, S.A., Sharma, R., Suran, S., Draheim, D. On Measuring Confounding Bias in Mixed Multidimensional Data // ICT for Intelligent Systems : proceedings of ICTIS 2024. Vol. 6. Singapore : Springer, 2024. p. 329–342. (Lecture notes in networks and systems ; 1112). https://doi.org/10.1007/978-981-97-6684-0_27