Hierarchical analysis of short defects between metal lines in CMOS IC
author
Pleskacz, Witold A.
Jenihhin, Maksim
Raik, Jaan
Rakowski, Michal
Ubar, Raimund-Johannes
Kuzmicz, Wieslaw
statement of authorship
Witold A.Pleskacz, Maksim Jenihhin, Jaan Raik, Michal Rakowski, Raimund Ubar, Wieslaw Kuzmicz
source
Proceedings : 11th EUROMICRO Conference on Digital System Design : Architectures, Methods and Tools : (DSD 2008) : September 3-5, 2008, Parma, Italy
location of publication
Los Alamitos
publisher
IEEE Computer Society
year of publication
2008
pages
p. 729-734 : ill
ISBN
978-0-7695-3277-6
notes
Bibliogr.: 19 ref