A hybrid BIST architecture and its optimization for SoC testing
author
Jervan, Gert
Peng, Zebo
Ubar, Raimund-Johannes
Kruus, Helena
statement of authorship
Gert Jervan, Zebo Peng, Raimund Ubar, Helena Kruus
source
Proceedings of the 3rd International Symposium on Quality Electronic Design : ISQED 2002, March 18-21, 2002, San Jose, California
location of publication
Washington
publisher
IEEE Computer Society
year of publication
2002
pages
p. 273-279 : ill
ISBN
0-7695-1561-4
notes
Bibliogr.: 15 ref