Modeling soft-error reliability under variability
author
Balakrishnan, Aneesh
Cardoso Medeiros, Guilherme
Gürsoy, Cemil Cem
Hamdioui, Said
Jenihhin, Maksim
Alexandrescu, Dan
statement of authorship
Aneesh Balakrishnan; Guilherme Cardoso Medeiros; Cemil Cem Gürsoy; Said Hamdioui; Maksim Jenihhin; Dan Alexandrescu
source
2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 6-8 Oct. 2021
publisher
IEEE
year of publication
2021
pages
p. 1-6
conference name, date
2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 6-8 Oct. 2021
url
https://doi.org/10.1109/DFT52944.2021.9568295
subject term
analüüs
termilised mõõtmised
vead
modelleerimine (teadus)
tõrked
pinge
keyword
Negative bias temperature instability
analytical models
thermal variables control
voltage
aging
very large scale integration
data models
ISSN
2765-933X
ISBN
978-1-6654-1609-2
notes
Bibliogr.: 19 ref
scientific publication
teaduspublikatsioon
classifier
3.1
TTÜ department
arvutisüsteemide instituut
language
inglise
Uurimisrühm
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems