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Hamdioui, Said (author)
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journal article EST
/
journal article ENG
Automated identification of application-dependent safe faults in automotive systems-on-a-chips
Bagbaba, Ahmet Cagri
;
Augusto da Silva, Felipe
;
Sonza Reorda, Matteo
;
Hamdioui, Said
;
Jenihhin, Maksim
;
Sauer, Christian
Electronics
2022
/
art. 319
https://doi.org/10.3390/electronics11030319
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
Seotud publikatsioonid
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
2
book article
Combining fault analysis technologies for ISO26262 functional safety verification
Augusto da Silva, Felipe
;
Bagbaba, Ahmet Cagri
;
Hamdioui, Said
;
Sauer, Christian
2019 IEEE 28th Asian Test Symposium (ATS) : 10–13 December 2019, Kolkata, India : proceedings
2019
/
p. 129–134 : ill
https://doi.org/10.1109/ATS47505.2019.00024
book article
Seotud publikatsioonid
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
3
book article
Determined-safe faults identification : a step towards ISO26262 hardware compliant designs
Augusto da Silva, Felipe
;
Bagbaba, Ahmet Cagri
;
Sartoni, Sandro
;
Cantoro, Riccardo
;
Sonza Reorda, Matteo
;
Hamdioui, Said
;
Sauer, Christian
2020 25th IEEE European Test Symposium (ETS)
2020
/
6 p. : ill
https://doi.org/10.1109/ETS48528.2020.9131568
book article
Seotud publikatsioonid
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
4
book article
A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMs
Cardoso Medeiros, Guilherme
;
Gürsoy, Cemil Cem
;
Fieback, Moritz
;
Wu, Lizhou
;
Jenihhin, Maksim
;
Taouil, Mottaqiallah
;
Hamdioui, Said
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings
2020
/
p. 792-797
https://doi.org/10.23919/DATE48585.2020.9116278
book article
5
book article
Efficient methodology for ISO26262 functional safety verification
Augusto da Silva, Felipe
;
Bagbaba, Ahmet Cagri
;
Hamdioui, Said
;
Sauer, Christian
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019, Rhodes, Greece
2019
/
p. 255-256
https://doi.org/10.1109/IOLTS.2019.8854449
book article
Seotud publikatsioonid
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
6
book article EST
/
book article ENG
IEEE European Test Symposium (ETS)
Eggersgluss, Stephan
;
Hamdioui, Said
;
Jutman, Artur
;
Michael, Maria K.
;
Raik, Jaan
2019 IEEE International Test Conference (ITC)
2019
/
4 p
https://doi.org/10.1109/ITC44170.2019.9000148
Conference proceeding at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
7
book article
LiD-CAT: A lightweight detector for cache ATtacks
Reinbrecht, Cezar
;
Hamdioui, Said
;
Taouil, Mottaqiallah
;
Niazmand, Behrad
;
Ghasempouri, Tara
;
Raik, Jaan
;
Sepulveda, Johanna
2020 IEEE European Test Symposium (ETS) : ETS 2020, May 25-29, 2020 Tallinn, Estonia : proceedings
2020
/
6 p. : ill
https://doi.org/10.1109/ETS48528.2020.9131603
book article
8
book article EST
/
book article ENG
Memristive device based circuits for computation-in-memory architectures
Lebdeh, Muath Abu
;
Reinsalu, Uljana
;
Nguyen, Hoang Anh Du
;
Wong, Stephan
;
Hamdioui, Said
2019 IEEE International Symposium on Circuits and Systems (ISCAS) : proceedings
2019
/
5 p. : ill
https://doi.org/10.1109/ISCAS.2019.8702542
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
9
book article
Modeling soft-error reliability under variability
Balakrishnan, Aneesh
;
Cardoso Medeiros, Guilherme
;
Gürsoy, Cemil Cem
;
Hamdioui, Said
;
Jenihhin, Maksim
;
Alexandrescu, Dan
2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 6-8 Oct. 2021
2021
/
p. 1-6
https://doi.org/10.1109/DFT52944.2021.9568295
book article
Seotud publikatsioonid
1
A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
10
book article
On BTI aging rejuvenation in memory address decoders
Gürsoy, Cemil Cem
;
Kraak, Daniel
;
Ahmed, Foisal
;
Taouil, Mottaqiallah
;
Jenihhin, Maksim
;
Hamdioui, Said
2022 IEEE 23rd Latin American Test Symposium, LATS 2022
2022
/
Code 184360
https://doi.org/10.1109/LATS57337.2022.9936940
book article
11
book article
A security verification template to assess cache architecture vulnerabilities
Ghasempouri, Tara
;
Raik, Jaan
;
Paul, Kolin
;
Reinbrecht, Cezar
;
Hamdioui, Said
;
Taouil, M.
2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), April 22nd – 24th 2020 Novi Sad, Serbia : Proceedings
2020
/
art. 9095707, 6 p
https://doi.org/10.1109/DDECS50862.2020.9095707
book article
12
journal article EST
/
journal article ENG
Survey on architectural attacks : a unified classification and attack model
Ghasempouri, Tara
;
Raik, Jaan
;
Reinbrecht, Cezar
;
Hamdioui, Said
;
Hamdioui, Said
ACM Computing Surveys
2023
/
art. 42
https://doi.org/10.1145/3604803
Journal metrics at Scopus
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Article at WOS
journal article EST
/
journal article ENG
13
book article
Use of formal methods for verification and optimization of fault lists in the scope of ISO26262
Augusto da Silva, Felipe
;
Bagbaba, Ahmet Cagri
;
Hamdioui, Said
;
Sauer, Christian
2018 Design and Verification Conference (DVCON) Europe : [proceedings]
2018
/
6 p. : ill
https://repository.tudelft.nl/islandora/object/uuid%3Adbd7f22d-0324-45f5-9180-8fe3fc95a9ce
book article
Seotud publikatsioonid
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
14
journal article EST
/
journal article ENG
Using STLs for effective in-field test of GPUs
Rodriguez Condia, Josie E.
;
Da Silva, Felipe Augusto
;
Bagbaba, Ahmet Cagrl
;
Guerrero-Balaguera, Juan-David
;
Hamdioui, Said
;
Sauer, Christian
;
Reorda, Matteo Sonza
IEEE Design and Test
2023
/
p. 109-117
https://doi.org/10.1109/MDAT.2022.3188573
Journal metrics at Scopus
Article at Scopus
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Article at WOS
journal article EST
/
journal article ENG
15
journal article EST
/
journal article ENG
Verifying cache architecture vulnerabilities using a formal security verification flow
Ghasempouri, Tara
;
Raik, Jaan
;
Paul, Kolin
;
Reinbrecht, Cezar
;
Hamdioui, Said
;
Taouil, Mottaqiallah
Microelectronics reliability
2021
/
art. 114085
https://doi.org/10.1016/j.microrel.2021.114085
Journal metrics at Scopus
Article at Scopus
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Article at WOS
journal article EST
/
journal article ENG
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Hamdioui, Said
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