Test generation for sequential digital systems based on symbolic simulation
author
Skobtsov, Vadim
Skobtsov, Yu.
statement of authorship
V.Skobtsov, Yu.Skobtsov
source
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
location of publication
[Tallinn]
year of publication
1998
pages
p. 341-344: ill
subject term
digitaaltehnika
testimine
simulatsioon
ISBN
9985-59-081-3
notes
Bibl. 7 ref
language
inglise