IJTAG-compatible symptom-based SEU monitors for FPGA DNN accelerators
author
Cherezova, Natalia
Jenihhin, Maksim
Jutman, Artur
statement of authorship
Natalia Cherezova, Maksim Jenihhin, Artur Jutman
source
2024 IEEE International Conference on Design, Test and Technology of Integrated Systems (DTTIS)
location of publication
Piscataway, New Jersey
publisher
IEEE
year of publication
2024
pages
6 p. : ill
conference name, date
IEEE 2nd International Conference on Design, Test and Technology of Integrated Systems (DTTIS), 14-16 Oct. 2024
conference location
Aix-En-Provence, France
url
https://doi.org/10.1109/DTTIS62212.2024.10780417
subject term
kiirendid
tõrketaluvus
vead
Scopus
https://www.scopus.com/pages/publications/85214972948?origin=resultslist
WOS
https://www.webofscience.com/wos/woscc/full-record/WOS:001468545500035
keyword
DNN accelerator
fault tolerance
FPGA
reliability
ISBN
979-8-3503-6312-8
notes
Bibliogr.: 28 ref
scientific publication
teaduspublikatsioon
classifier
3.1
TalTech department
arvutisüsteemide instituut
language
inglise