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1

book article

Active redundancy in fault tolerance : A modular switch level solution with synchronous switchingShirodkar, Aditya; Banavath, Satish Naik; Chub, Andrii; Mandrioli, Riccardo; Ricco, Mattia2025 IEEE Seventh International Conference on DC Microgrids (ICDCM)2025 / 6 p https://doi.org/10.1109/ICDCM63994.2025.11144667

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book article EST / book article ENG

Active redundancy in isolated DC-DC converters: A modular solution for fault toleranceShirodkar, Aditya; Banavath, Satish Naik; Yadav, Neelesh; Chub, Andrii; Mandrioli, Riccardo2025 IEEE 19th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG)2025 / 5 p https://doi.org/10.1109/CPE-POWERENG63314.2025.11027280

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3

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Analysis and improvement of resilience for long short-term memory neural networksAhmadilivani, Mohammad Hasan; Raik, Jaan; Daneshtalab, Masoud; Kuusik, Alar2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)2023 / 4 p https://doi.org/10.1109/DFT59622.2023.10313559

book article
Related publications 1
- Assessment and Enhancement of Hardware Reliability for Deep Neural Networks = Riistvara töökindluse hindamine ja täiustamine süvanärvivõrkude jaoks
4

book article

AWAIT : an ultra-lightweight soft-error mitigation mechanism for network-on-chip linksJanson, Karl; Pihlak, Rene; Azad, Siavoosh Payandeh; Niazmand, Behrad; Jervan, Gert; Raik, Jaan2018 13th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC), Lille, France, July 9th-11th, 20182018 / p. 1-6 : ill https://doi.org/10.1109/ReCoSoC.2018.8449374

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Challenges of reliability assessment and enhancement in autonomous systemsJenihhin, Maksim; Sonza Reorda, Matteo; Balakrishnan, Aneesh; Alexandrescu, Dan2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2019)2019 / 6 p https://doi.org/10.1109/DFT.2019.8875379

book article
Related publications 1
- A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
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Cost-effective fault tolerance for CNNs using parameter vulnerability based hardening and pruningAhmadilivani, Mohammad Hasan; Mousavi, Seyedhamidreza; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, Maksim2024 IEEE 30th International Symposium on On-line Testing and Robust System Design (IOLTS) : IOLTS 2024 : July 03rd-05th 2024, Rennes, Brittany, France2024 / 7 p https://doi.org/10.1109/IOLTS60994.2024.10616072 Article at Scopus Article at WOS

book article
Related publications 1
- Assessment and Enhancement of Hardware Reliability for Deep Neural Networks = Riistvara töökindluse hindamine ja täiustamine süvanärvivõrkude jaoks
7

book article

Effect of PM parameters variability on the operation quantities of a wind generatorKallaste, Ants; Belahcen, Anouar; Vaimann, Toomas2015 IEEE Workshop on Electrical Machines Design, Control and Diagnosis (WEMDCD) : proceedings : Castello del Valentino, Torino, Italy, 26-27 March, 20152015 / p. 242-247 : ill http://dx.doi.org/10.1109/WEMDCD.2015.7194536

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Event-based control for differentially flat systems: application to autonomous underwater vehicleKaldmäe, Arvo; Kotta, Ülle; Meurer, Christian; Simha, AshutoshIFAC-PapersOnLine2019 / p. 180-185 https://doi.org/10.1016/j.ifacol.2019.11.775 Conference proceedings at Scopus Article at Scopus Article at WOS

journal article EST / journal article ENG
9

journal article

Fault tolerance in integration interfaces of business softwareLemmik, Rivo; Karjust, Kristo; Otto, TaunoInternational Journal Of Scientific Knowledge (Computing and Information Technology) IJSK2014 / p. 35-43 : ill

journal article
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journal article EST / journal article ENG

FESDA : fog-enabled secure data aggregation in smart grid IoT networkSaleem, Ahsan; Khan, Abid; Malik, Saif Ur Rehman; Pervaiz, Haris; Malik, Hassan; Alam, Masoom; Jindal, AnishIEEE Internet of Things Journal2020 / p. 6132-6142 https://doi.org/10.1109/JIOT.2019.2957314 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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11

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Handling of SETs on NoC links by exploitation of inherent redundancy in circular input buffers [Online resource]Janson, Karl; Pihlak, Rene; Azad, Siavoosh Payandeh; Niazmand, Behrad; Jervan, Gert; Raik, JaanBEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 20182018 / 4 p.: ill https://doi.org/10.1109/BEC.2018.8600989

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Hybrid DC–DC converters with topology morphing control and post-fault operation capabilityVinnikov, Dmitri; Chub, Andrii; Korkh, Oleksandr; Blinov, Andrei; Liivik, ElizavetaElectrimacs 2019 : Selected Papers, Vol. 12020 / p. 433-445 https://doi.org/10.1007/978-3-030-37161-6_33 Conference proceeding at Scopus Article at Scopus

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NOC mapping and schedulingNikiforov, DenissInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 73-78 : ill

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Operation of Single-Chip MOSFET and IGBT Devices after failure due to repetitive avalanche [Electronic resource]Blinov, Andrei; Norrga, Staffan; Tibola, GabrielEPE'15 ECCE Europe : 8-10 September 2015, Geneva, Switzerland : 17th European Conference on Power Electronics and Applications2015 / p. 1-9 : ill. [USB] http://dx.doi.org/10.1109/EPE.2015.7309190

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RESCUE EDA Toolset for interdependent aspects of reliability, security and quality in nanoelectronic systems designGürsoy, Cemil Cem; Cardoso Medeiros, Guilherme; Chen, Juanho; Balakrishnan, Aneesh; Lai, Xinhui; Bagbaba, Ahmet Cagri; Raik, Jaan; Jenihhin, MaksimDATE 20192019 / 1 p. : ill https://doi.org/10.5281/zenodo.3362529 https://past.date-conference.com/

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RESCUE: interdependent challenges of reliability, security and quality in nanoelectronic systemsJenihhin, Maksim; Raik, Jaan2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) : proceedings2020 / art. 19690741 , 6 p https://doi.org/10.23919/DATE48585.2020.9116558

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journal article

Self-healing photovoltaic microconverter with zero redundancy and accurate low-cost fault detectionBakeer, Abualkasim Ahmed Ali; Chub, Andrii; Vinnikov, DmitriIEEE transactions on industrial electronics2024 / p. 646-656 https://doi.org/10.1109/TIE.2023.3250836

journal article
Related publications 1
- Fault-tolerant galvanically isolated DC‑DC converters with zero redundancy = Null-liiasusega veatolerantsed galvaanilise isolatsiooniga alalispingemuundurid
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book article

Short-circuit fault detection and remedial in full-bridge rectifier of series resonant DC-DC converter based on inductor voltage signatureBakeer, Abualkasim Ahmed Ali; Chub, Andrii; Vinnikov, Dmitri2020 IEEE 61st International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON), Riga, Latvia, Nov. 5-7, 2020 : conference proceedings2020 / 6 p. : ill https://doi.org/10.1109/RTUCON51174.2020.9316482

book article
Related publications 1
- Fault-tolerant galvanically isolated DC‑DC converters with zero redundancy = Null-liiasusega veatolerantsed galvaanilise isolatsiooniga alalispingemuundurid
19

journal article EST / journal article ENG

Systematic review of fault tolerant techniques in underwater sensor networksVihman, Lauri; Kruusmaa, Maarja; Raik, JaanSensors2021 / art. 3264 https://doi.org/10.3390/s21093264 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
Related publications 1
- Data-driven fault-resilient cross-layer sensor network architecture = Andmepõhine tõrkekindel kihtideülene sensorvõrgu arhitektuur
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Zero-memory-overhead clipping-based fault tolerance for LSTM deep neural networksParchekani, Bahram; Nazari, Samira; Ahmadilivani, Mohammad Hasan; Azarpeyvand, Ali; Raik, Jaan; Ghasempouri, Tara; Daneshtalab, Masoud37th IEEE International Symposium on Defect and Fault Tolerancein VLSI and Nanotechnology Systems, Harwell, Oxfordshire, Didcot, UK, October 8th - 10th, 20242024 / 4 p. : ill https://doi.org/10.1109/DFT63277.2024.10753533 Conference proceedings at Scopus Article at Scopus

book article
Related publications 1
- Assessment and Enhancement of Hardware Reliability for Deep Neural Networks = Riistvara töökindluse hindamine ja täiustamine süvanärvivõrkude jaoks
21

journal article EST / journal article ENG

Topology-morphing photovoltaic microconverter with wide MPPT voltage window and post-fault operation capabilityVinnikov, Dmitri; Chub, Andrii; Zinchenko, Denys; Sidorov, VadimIEEE Access2020 / art. 9171332, p. 153941-153955 : ill https://doi.org/10.1109/ACCESS.2020.3017805 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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22

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Toward software-defined networking-based IoT frameworks : a systematic literature review, taxonomy, open challenges and prospectsSiddiqui, Shahbaz; Hameed, Sufian; Shah, Syed Attique; Aneiba, Adel; Draheim, Dirk; Dustdar, SchahramIEEE Access2022 / p. 70850-70901 https://doi.org/10.1109/ACCESS.2022.3188311 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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