Active redundancy in fault tolerance : A modular switch level solution with synchronous switching
statement of authorship                    
                    
Aditya Shirodkar, Satish Naik Banavath, Andrii Chub, Riccardo Mandrioli, Mattia Ricco
                            
                    
publisher                    
                    
                
year of publication                    
                    
                
pages                    
                    
6 p
                            
                    
conference name, date                    
                    
7th IEEE International Conference on DC Microgrids (ICDCM 2025), June 4 - 6, 2025
                            
                    
conference location                    
                    
Tallinn, Estonia
                            
                    
subject term                    
                    
                
ISBN                    
                    
979-8-3315-1275-0
                            
                    
scientific publication                    
                    
teaduspublikatsioon
                            
                    
classifier                    
                    
                
TalTech department                    
                    
                
language                    
                    
inglise
                            
                    
                                    Shirodkar, A., Banavath, S. N., Chub, A., Mandrioli, R., Ricco, M. Active redundancy in fault tolerance : A modular switch level solution with synchronous switching // 2025 IEEE Seventh International Conference on DC Microgrids (ICDCM). : IEEE, 2025. 6 p.  https://doi.org/10.1109/ICDCM63994.2025.11144667