Synthesis of high-level decision diagrams for functional test pattern generation
author
Ubar, Raimund-Johannes
Raik, Jaan
Karputkin, Anton
Tombak, Mati
statement of authorship
Raimund Ubar, Jaan Raik, Anton Karputkin, Mati Tombak
source
Proceedings of the 16th International Conference Mixed Design of Integrated Circuits and Systems MIXDES 2009 : Lodz, Poland, 25-27 June, 2009
location of publication
Lodz
publisher
Technical University of Lodz
year of publication
2009
pages
p. 519-524 : ill
subject term
digitaaltehnika
otsustusdiagrammid
testimine
keyword
digital systems
register transfer level modeling decision diagams
symbolic execution
superposition of graphs
ISBN
978-83-928756-0-4
notes
Bibliogr.: 33 ref
TalTech department
arvutitehnika instituut
informaatikainstituut
language
inglise