Hierarchical approach to test generation for digital systems at system, circuit and defect levels
author
Ubar, Raimund-Johannes
statement of authorship
R.Ubar
source
45. Internationales Wissenschaftliches Kolloquium, 04.-06.10.2000 : Tagungsband
location of publication
[Ilmenau]
publisher
Technische Universität Ilmenau
year of publication
2000
pages
S. 711-716 : Ill
notes
Bibliogr.: 8 Tit. Tiitellehe pöördel ISSN 0943-7207