Multi-level test generation for digital systems at system, circuit and defect levels
author
Ubar, Raimund-Johannes
statement of authorship
R. Ubar
source
Proceedings of the 7th International Scientific Conference "Theory and Technique of Information Transmission, Reception and Processing" : Tuapse, October 1-4, 2001
location of publication
[Harkov]
publisher
[Harkov University of Technology]
year of publication
2001
pages
p. 286-288
conference name, date
7th International Scientific Conference "Theory and Technique of Information Transmission, Reception and Processing", October 1-4, 2001
conference location
Tuapse, Russia
language
inglise