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Techniques for reliability in Edge-AI chips

author
Jenihhin, Maksim
Taheri, Mahdi
Cherezova, Natalia
Ahmadilivani, Mohammad Hasan
Rafiq, Ahsan
Raik, Jaan
Daneshtalab, Masoud
statement of authorship
M. Jenihhin, M. Taheri, N. Cherezova, M.H. Ahmadilivani, A. Rafiq, J. Raik, M. Daneshtalab
source
IEEE Top Picks in Test and Reliability Workshop at the International Test Conference 2024, San Diego, US, November 7-8, 2024
location of publication
Piscataway, New Jersey
publisher
IEEE
year of publication
2024
pages
p. 1-2
conference name, date
IEEE Top Picks in Test and Reliability Workshop at the International Test Conference 2024, November 7-8, 2024
conference location
San Diego, US
url
https://people.rennes.inria.fr/Marcello.Traiola/TPTR2024/event_program.html
subject term
tehisintellekt
integraallülitused
scientific publication
teaduspublikatsioon
classifier
3.4
language
inglise
Jenihhin, M., Taheri, M., Cherezova, N., Ahmadilivani, M.H., Rafiq, A., Raik, J., Daneshtalab, M. Techniques for reliability in Edge-AI chips // IEEE Top Picks in Test and Reliability Workshop at the International Test Conference 2024, San Diego, US, November 7-8, 2024. Piscataway, New Jersey : IEEE, 2024. p. 1-2. https://people.rennes.inria.fr/Marcello.Traiola/TPTR2024/event_program.html