High-level test synthesis with hierarchical test generation
author
Jervan, Gert
Eles, Petru
Peng, Zebo
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
Gert Jervan, Petru Eles, Zebo Peng, Jaan Raik, Raimund Ubar
source
17th NORCHIP Conference : Oslo, Norway, 8-9 November 1999 : proceedings
location of publication
[S.l.]
publisher
IEEE
year of publication
1999
pages
p. 291-296
subject term
testid
testimine
süntees
ISBN
87-982637-2-2
notes
Bibl. 9 ref
language
inglise